Simple circuit brings topological insulators closer to practical electrical measurement standards

by Julius Maximilian University of Würzburg

edited by Sadie Harley , reviewed by Robert Egan

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Add as preferred source A. Left: An angled photograph of device D1. Right: Optical microscope image of the same device (prior to bonding). Letters A–D label the contacts along the outer perimeter, a–d those along the inner perimeter, and G denotes the gate contact. B. A zoomed-in optical microscope image of the contact geometry for each of the two studied devices D1 and D2. Credit: Nature Communications (2026). DOI: 10.1038/s41467-026-75851-7 Researchers at the University of Würzburg have succeeded in detecting exceptionally robust electrical transport in a topological insulator. This could lead to new metrological applications. The work is published in the journal Nature Communications .