Charge-trapping-associated threshold-voltage shift during electrical aging in OLEDs with electron-transport layers having a giant surface potential
Researchers investigated the degradation of OLEDs caused by charge trapping in electron-transport layers that exhibit a giant surface potential. The study links localized charge trapping to increased threshold voltage and delayed hole injection, offering insights for improving OLED longevity.
Why it matters
These findings provide a pathway for engineers to improve the stability and lifespan of display technologies used in consumer electronics.
Scientific Reports ( 2026 ) Cite this article
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